Design of routing-constrained low power scan chains

Design of routing-constrained low power scan chains
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DOI:
10.1109/delta.2004.10009
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发表时间:
2004-01
期刊:
Proceedings. DELTA 2004. Second IEEE International Workshop on Electronic Design, Test and Applications
影响因子:
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通讯作者:
Y. Bonhomme;P. Girard;L. Guiller;C. Landrault;S. Pravossoudovitch;A. Virazel
Y. Bonhomme;P. Girard;L. Guiller;C. Landrault;S. Pravossoudovitch;A. Virazel
中科院分区:
其他
文献类型:
--
作者:
Y. Bonhomme;P. Girard;L. Guiller;C. Landrault;S. Pravossoudovitch;A. Virazel

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基于扫描的架构虽然广泛应用于现代设计中,但功耗昂贵。最近,我们提出了一种基于扫描单元聚类和重新排序的技术,该技术允许设计低功耗扫描链。该技术的主要特点是在满足扫描路由约束的同时最大限度地降低扫描测试期间的功耗。在本文中,我们提出了该技术的新版本。聚类过程经过修改,可以更好地分布每个聚类中的扫描单元,从而实现更重要的功耗降低。本文末尾提供的结果强调了这一点,并表明扫描设计约束(扫描连接的长度、拥塞问题)仍然得到满足。
Scan-based architectures, though widely used in modern designs, are expensive in power consumption. Recently, we proposed a technique based on clustering and reordering of scan cells that allows to design low power scan chains. The main feature of this technique is that power consumption during scan testing is minimized while constraints on scan routing are satisfied. In this paper, we propose a new version of this technique. The clustering process has been modified to allow a better distribution of scan cells in each cluster and hence lead to more important power reductions. Results are provided at the end of the paper to highlight this point and show that scan design constraints (length of scan connections, congestion problems) are still satisfied.