MAPPING INTERACTION FORCES WITH THE ATOMIC-FORCE MICROSCOPE
MAPPING INTERACTION FORCES WITH THE ATOMIC-FORCE MICROSCOPE
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DOI：
10.1016/s0006-3495(94)81011-2
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发表时间：
1994-06-01
影响因子：
3.4
通讯作者：
HANSMA, PK
中科院分区：
文献类型：
--
作者：
RADMACHER, M;CLEVELAND, JP;HANSMA, PK
当样品在尖端下进行光栅扫描时，记录力曲线。这为原子力显微镜成像提供了新的机会：样品的几个特征可以同时测量，例如，形貌、附着力、弹性、范德华和静电相互作用。金属薄膜、溶菌酶聚集体和DNA单分子的几个特征的图像说明了新的机会。
Force curves were recorded as the sample was raster-scanned under the tip. This opens new opportunities for imaging with the atomic force microscope: several characteristics of the samples can be measured simultaneously, for example, topography, adhesion forces, elasticity, van der Waals, and electrostatic interactions. The new opportunities are illustrated by images of several characteristics of thin metal films, aggregates of lysozyme, and single molecules of DNA.