A new ion sensing deep atomic force microscope.
A new ion sensing deep atomic force microscope.
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DOI：
10.1063/1.4893640
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发表时间：
2014-08
期刊：
影响因子：
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通讯作者：
B. Drake;C. Randall;Daniel C Bridges;P. Hansma
中科院分区：
文献类型：
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作者：
B. Drake;C. Randall;Daniel C Bridges;P. Hansma
在这里，我们描述了一种新型的具有离子传感能力的深原子力显微镜(AFM)。一种新型的探头组件结合了一个微吸管，它既可以用于感应离子电流，也可以作为AFM成像的尖端。与以往的离子传感原子力显微镜相比，该仪器的主要优点是在一种新型悬浮系统中使用了传统的微吸管。本文主要研究了利用力反馈实现原子力显微镜接触式工作时对离子电流的被动传感。同时获得了两幅图像：(1)原子力显微镜地形图像和(2)离子流图像。例如，带有微通道的MEMS器件的两幅图像显示，当吸管尖端越过通道边缘时，离子电流中的峰值。这种离子传感原子力显微镜还可以用于其他模式，包括力反馈轻击模式和利用离子电流进行反馈的非接触模式，如扫描离子电导显微镜。该仪器足够温和，可以用于一些生物样本，如植物叶片。
Here we describe a new deep atomic force microscope (AFM) capable of ion sensing. A novel probe assembly incorporates a micropipette that can be used both for sensing ion currents and as the tip for AFM imaging. The key advance of this instrument over previous ion sensing AFMs is that it uses conventional micropipettes in a novel suspension system. This paper focuses on sensing the ion current passively while using force feedback for the operation of the AFM in contact mode. Two images are obtained simultaneously: (1) an AFM topography image and (2) an ion current image. As an example, two images of a MEMS device with a microchannel show peaks in the ion current as the pipette tip goes over the edges of the channel. This ion sensing AFM can also be used in other modes including tapping mode with force feedback as well as in non-contact mode by utilizing the ion current for feedback, as in scanning ion conductance microscopy. The instrument is gentle enough to be used on some biological samples such as plant leaves.