High-throughput measurement method for time-temperature-transformation diagram of thin film amorphous alloys
High-throughput measurement method for time-temperature-transformation diagram of thin film amorphous alloys
复制标题
薄膜非晶合金时间-温度-转变图的高通量测量方法
DOI：
10.1143/apex.3.125601
复制
发表时间：
2011
影响因子：
2.3
通讯作者：
Hata S.
中科院分区：
文献类型：
--
作者：
Aono Y.;Sakurai J.;Ishida T.;Shimokohbe A.;Hata S.
非晶合金的时间-温度转变（TTT）图对合金的应用具有重要意义。然而，用传统的方法测量它是一个耗时的过程。我们提出了一种高通量的测量方法来编制薄膜非晶合金的TTT图。该方法采用温度梯度炉系统。薄膜样品在温度梯度下等温加热，并通过热成像进行监测。热成像可以检测结晶。因此，可以一次测量不同温度下结晶所需的时间。通过与传统方法计算结果的比较，证明了该方法的有效性。
The time–temperature-transformation (TTT) diagram of amorphous alloys is important for the applications of alloys. However, measurement for it by the conventional method is a time-consuming process. We propose a high-throughput measurement method for compiling TTT diagrams of thin film amorphous alloys. For this method, a temperature gradient furnace system is used. The thin film sample is isothermally heated with a temperature gradient and monitored by thermography. Thermography can detect crystallization. Therefore, the times required for crystallization at various temperatures can be measured at once. The validity of this method is shown by comparison with the results of the conventional method.