Investigation of a low-stress and low-contamination clamping method for large-aperture optics.
Investigation of a low-stress and low-contamination clamping method for large-aperture optics.
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DOI：
10.1177/0036850419880109
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发表时间：
2020-01
期刊：
影响因子：
2.1
通讯作者：
Pei, Guoqing
中科院分区：
文献类型：
--
作者：
Wang, Hui;Long, Kai;Zhang, Zheng;Yi, Congzhi;Quan, Xusong;Pei, Guoqing
为了降低钕玻璃表面SiO2溶胶-凝胶膜的初始接触封接应力，有效控制组装过程中应力引起的膜屑对表面的污染，研究了一种新型的真空夹持方法，以达到低应力、低污染的目的。本文通过理论分析、数值模拟和现场试验验证了该方法的可行性。力学模拟结果表明，在相同的径向压缩条件下，O形圈橡胶的中空度越高，钕玻璃上的接触应力越小。此外，SiO2溶胶-凝胶膜的微观结构进行了观察，通过扫描电子显微镜，分析了损坏的机制，以优化组装应力。通过优化蜂窝结构的中空度分布，证明了蜂窝结构由于变形较大而具有较低的接触应力。最后，实验结果验证了低应力真空夹持方法可以满足钕玻璃严格的表面清洁度要求。该研究也为其他大口径光学器件的清洁装配提供了一种有前途的方法。
Motivated by the need to decrease initial contact seal stress on Nd:glass coated with SiO2 sol–gel film and effectively control the surface contaminants from film debris induced by stress in the assembly process, a novel vacuum clamping method is studied to achieve the purpose of low stress and low contamination. In this article, theoretical analyses, numerical simulations, and field experiments are used to verify the feasibility of this method. Mechanical simulation results indicate that under the same radial compression conditions, the higher the hollowness of the O-ring rubber, the less the contact stress on Nd:glass. In addition, microstructures of the SiO2 sol–gel film are observed by scanning electron microscopy, and the damage mechanism is analyzed in order to optimize assembly stress. By optimizing the distribution of hollowness, the honeycomb structure is proved to have lower contact stress due to its larger deformation. Finally, experimental results verify that the low-stress vacuum clamping method can meet the strict surface cleanliness requirements of Nd:glass. This study also provides a promising method for clean assembly of other large-aperture optics.
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