Measurement of ultrafast optical nonlinearities using a modified Sagnac interferometer.

Measurement of ultrafast optical nonlinearities using a modified Sagnac interferometer.
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DOI：
10.1364/ol.16.001334
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发表时间：
1991-09
期刊：
Optics letters
影响因子：
3.6
通讯作者：
M. C. Gabriel;N. Whitaker;C. Dirk;M. Kuzyk;M. Thakur
M. C. Gabriel;N. Whitaker;C. Dirk;M. Kuzyk;M. Thakur
中科院分区：
物理与天体物理2区
文献类型：
--
作者：
M. C. Gabriel;N. Whitaker;C. Dirk;M. Kuzyk;M. Thakur

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A method for the measurement of fast, intensity-dependent refractive-index changes with the use of a modified Sagnac ring interferometer is presented. The measurement is not degraded by slowly responding background index changes. Nonlinear refractive-index changes in an undoped silicon wafer, and in poly-bis toluene sulfonate polydiacetylene and dye-doped polymethyl methacrylate waveguides, were measured with the use of a cw mode-locked Nd:YAG laser.