Structural and binding properties of vacancy clusters in silicon

Structural and binding properties of vacancy clusters in silicon
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硅中空位簇的结构和结合特性

DOI:
10.1209/epl/i1998-00419-1
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发表时间:
1998
期刊:
EPL
影响因子:
1.8
通讯作者:
T. D. Rubia
T. D. Rubia
中科院分区:
物理与天体物理4区
文献类型:
--
作者:
A. Bongiorno;L. Colombo;T. D. Rubia

文献摘要

被引文献

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通过大规模量子模拟,我们研究了 n ≤ 35 时硅中空位簇 Vn 的形成和结合。我们表明存在不同的生长模式,并且能量和拓扑参数之间的相互作用决定了最稳定的聚集体。
By means of large-scale quantum simulations we investigate the formation and binding of vacancy clusters Vn in silicon for n ≤ 35. We show that different growth patterns exist and that an interplay between energy and topology arguments determines the most stable aggregates.