Low probability of bulk spin-flip in mesoscopic Cu wires
Low probability of bulk spin-flip in mesoscopic Cu wires
复制标题
介观铜线中整体自旋翻转的可能性较低
DOI：
10.1088/0022-3727/49/18/185003
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发表时间：
2016
期刊：
影响因子：
--
通讯作者：
Ji Yi
中科院分区：
文献类型：
--
作者：
Cai Yunjiao;Luo Yongming;Zhou Chao;Qin Chuan;Chen Shuhan;Wu Yizheng;Ji Yi
从体缺陷和声子的自旋翻转概率确定的介观铜通道的非局域自旋阀（NLSV）。的NLSV自旋信号进行了分析，通过一种新的方法，始终提取原位值的Cu自旋扩散长度，有效的自旋注入（检测）极化，和Cu电阻率。NLSV之间的自旋注入器（检测器）的大小变化的处理通过归一化的自旋信号，以与标准注入器（检测器）的大小相称。通过测量同一衬底上的许多NLSV，统计地解释了微观结构的变化。根据Cu在10 K和295 K下的电阻率和自旋扩散长度，确定体缺陷和声子的自旋翻转几率分别为（3.9 ± 0.8）× 10−4和（2.8 ± 1.2）× 10−4。
Spin-flip probabilities from bulk defects and phonons are determined for the mesoscopic Cu channels of nonlocal spin valves (NLSVs). The NLSV spin signals are analyzed by a new approach to consistently extract the in situ values of the Cu spin diffusion length, effective spin injection (detection) polarization, and Cu resistivity. The size variations of the spin injectors (detectors) between NLSVs are treated by normalizing the spin signals to be commensurate with a standard injector (detector) size. The microstructure variations are statistically accounted for by measuring many NLSVs on the same substrate. From the Cu resistivity and spin diffusion lengths at 10 K and 295 K, the spin-flip probabilities from bulk defects and phonons are determined to be (3.9 ± 0.8) × 10−4 and (2.8 ± 1.2) × 10−4, respectively.