Demonstration of transmission high energy electron microscopy

Demonstration of transmission high energy electron microscopy
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DOI:
10.1063/1.5011198
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发表时间:
2018-04
期刊:
SHOCK COMPRESSION OF CONDENSED MATTER - 2019: Proceedings of the Conference of the American Physical Society Topical Group on Shock Compression of Condensed Matter
影响因子:
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通讯作者:
F. Merrill;J. Goett;J. Gibbs;S. Imhoff;F. Mariam;C. Morris;L. Neukirch;J. Perry;D. Poulson;R. Simpson;P. Volegov;P. Walstrom;C. Wilde;C. Hast;K. Jobe;T. Smith;U. Wienands;A. Clarke;D. Tourret
F. Merrill;J. Goett;J. Gibbs;S. Imhoff;F. Mariam;C. Morris;L. Neukirch;J. Perry;D. Poulson;R. Simpson;P. Volegov;P. Walstrom;C. Wilde;C. Hast;K. Jobe;T. Smith;U. Wienands;A. Clarke;D. Tourret
中科院分区:
其他
文献类型:
--
作者:
F. Merrill;J. Goett;J. Gibbs;S. Imhoff;F. Mariam;C. Morris;L. Neukirch;J. Perry;D. Poulson;R. Simpson;P. Volegov;P. Walstrom;C. Wilde;C. Hast;K. Jobe;T. Smith;U. Wienands;A. Clarke;D. Tourret

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High energy electrons have been used to investigate an extension of transmission electron microscopy. This technique, transmission high energy electron microscopy (THEEM), provides two additional capabilities to electron microscopy. First, high energy electrons are more penetrating than low energy electrons, and thus, they are able to image through thicker samples. Second, the accelerating mode of a radio-frequency linear accelerator provides fast exposures, down to 1 ps, which are ideal for flash radiography, making THEEM well suited to study the evolution of fast material processes under dynamic conditions. Initial investigations with static objects and during material processing have been performed to investigate the capabilities of this technique.High energy electrons have been used to investigate an extension of transmission electron microscopy. This technique, transmission high energy electron microscopy (THEEM), provides two additional capabilities to electron microscopy. First, high energy electrons are more penetrating than low energy electrons, and thus, they are able to image through thicker samples. Second, the accelerating mode of a radio-frequency linear accelerator provides fast exposures, down to 1 ps, which are ideal for flash radiography, making THEEM well suited to study the evolution of fast material processes under dynamic conditions. Initial investigations with static objects and during material processing have been performed to investigate the capabilities of this technique.