Current-Based Testing of Optical Feedback Pixel Driver
Current-Based Testing of Optical Feedback Pixel Driver
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DOI：
10.1109/jdt.2009.2039986
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发表时间：
2010-03
影响因子：
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通讯作者：
N. Papadopoulos;D. K. Papakostas;A. Hatzopoulos
中科院分区：
文献类型：
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作者：
N. Papadopoulos;D. K. Papakostas;A. Hatzopoulos
提出了一种光反馈像素驱动器的测试方案，并利用HSPICE进行了仿真和讨论。该特定电路的基本特征是通过脉宽调制产生像素的灰度级。因此，必须测量或计算输出I像素电流的积分(与I OLED成正比)并用于测试。仿真结果表明，所提出的测试方法能够检测和识别高达96%的常见工艺缺陷。虽然I像素电流往往很小，但所使用的测量系统使用了专用仪器芯片，并通过HSPICE成功地进行了仿真和验证。
A testing scheme of an optical feedback pixel driver is proposed, discussed and simulated by HSPICE. A basic characteristic of the specific circuit is that the gray scales of the pixel are created by pulse width modulation. So, the integral of the output I pixel current (which is proportional to I oled) has to be measured or calculated and used for testing. The testing procedure that is proposed enables the detection and identification of common processing defects up to 96%, as verified from simulation results. Although I pixel current is tend to be very low, the measuring system used, using special instrumentation ICs, is successfully simulated and verified by HSPICE.