Diagnosis of multiple faults with highly compacted test responses
Diagnosis of multiple faults with highly compacted test responses
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DOI：
10.1109/ets.2014.6847796
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发表时间：
2014-05
期刊：
影响因子：
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通讯作者：
A. Cook;H. Wunderlich
中科院分区：
文献类型：
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作者：
A. Cook;H. Wunderlich
缺陷聚集，并且多个故障的概率显著高于仅单个故障概率的乘积。虽然这种观察有利于高产量，但它使故障诊断复杂化。在过程学习、产量提升和现场返回分析期间，将特别经常发生多个故障。本文提出了一种逻辑诊断算法，该算法对多故障具有鲁棒性，即使在嵌入式测试和内建自测试中产生的压缩测试响应上，也能够以高精度诊断多故障。所开发的解决方案利用MISR压缩机的线性特性来识别可能产生所观察到的故障签名的一组故障。实验结果表明，在精度上的提高高达22%，比传统的逻辑诊断解决方案，适合可比的压缩比。
Defects cluster, and the probability of a multiple fault is significantly higher than just the product of the single fault probabilities. While this observation is beneficial for high yield, it complicates fault diagnosis. Multiple faults will occur especially often during process learning, yield ramp-up and field return analysis. In this paper, a logic diagnosis algorithm is presented which is robust against multiple faults and which is able to diagnose multiple faults with high accuracy even on compressed test responses as they are produced in embedded test and built-in self-test. The developed solution takes advantage of the linear properties of a MISR compactor to identify a set of faults likely to produce the observed faulty signatures. Experimental results show an improvement in accuracy of up to 22 % over traditional logic diagnosis solutions suitable for comparable compaction ratios.