High-speed scanning Hall-probe microscopy for two-dimensional characterization of local critical current density in long-length coated conductor
High-speed scanning Hall-probe microscopy for two-dimensional characterization of local critical current density in long-length coated conductor
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高速扫描霍尔探针显微镜用于长涂层导体局部临界电流密度的二维表征
DOI：
10.1016/j.phpro.2012.03.452
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发表时间：
2012
期刊：
影响因子：
--
通讯作者：
H. Okamoto
中科院分区：
文献类型：
--
作者：
K. Higashikawa;K. Shiohara;Y. Komaki;K. Okumura;K. Imamura;M. Inoue;T. Kiss;Y. Iijima;T. Saitoh;T. Machi;M. Yoshizumi;T. Izumi;H. Okamoto
我们成功地显着提高了扫描霍尔探针显微镜的测量速度，用于对涂层导体中局部临界电流密度进行二维表征。典型的测量速度为36 m/h，纵向空间分辨率为1mm，宽度方向空间分辨率为40微米，并且速度和分辨率的组合可以根据需要改变。这比我们之前系统的速度快 200 倍，并且可以适用于长导体。根据剩磁状态下的磁场分布，我们可以无损地估计局部临界电流密度的面内分布。例如，我们可以确认 GdBCO 涂层导体中几乎均匀的局部特性，同时我们检测到导体边缘的一些缺陷。此外，我们还可以证实该方法对于多丝涂层导体的适用性。这些结果将有助于（1）原始导体的质量控制，（2）较细导体与较宽导体的质量控制，（3）多丝导体的质量控制，（4）了解宏观电流传输特性，（5）研究与制造过程相关的典型统计数据，等等。
We have succeeded in significant improvement in measuring speed of scanning Hall-probe microscopy for two-dimensional characterization of local critical current density in a coated conductor. A typical measuring speed was 36 m/h with a spatial resolution of 1mm in longitudinal direction and 40 micrometers in width direction while the combination of the speed and the resolution could be changed on demand. This was 200 times faster than the speed of our previous system, and could be applicable to a long-length conductor. From the magnetic field distribution in a remanent state, we could estimate in-plane distribution of local critical current density in nondestructive manner. For example, we could confirm almost homogeneous local properties in a GdBCO coated conductor, and at the same time we detected some defects in the edge of the conductor. Furthermore, we could also confirm the applicability of this method to a multifilamentary coated conductor. These results would be helpful for (1) quality control of an original conductor, (2) that of a finer conductor slit from a wider one, (3) that of a multifilamentary conductor, (4) understanding of macroscopic current transport properties, (5) investigating a typical statistics correlated with the fabrication process, and so on.