Observation of the screened potential and the Friedel oscillation by low-temperature scanning tunneling microscopy/spectroscopy
Observation of the screened potential and the Friedel oscillation by low-temperature scanning tunneling microscopy/spectroscopy
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DOI：
10.1016/j.apsusc.2009.07.023
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发表时间：
2009-10-30
影响因子：
6.7
通讯作者：
Hasegawa, Yukio
中科院分区：
文献类型：
--
作者：
Ono, Masanori;Nishio, Takahiro;Hasegawa, Yukio
使用低温扫描隧道显微镜/光谱学，我们已经开发了一种用于在高空间和能量分辨率下测量静电势的方法，并且在Si（111）root 3 X root 3-Ag表面上对由台阶边缘周围的二维表面电子屏蔽的电势进行了实空间观察，其中额外的电荷被局部化。在电势图像中，在电荷周围清楚地观察到特征衰变和Friedel振荡。(C)2009 Elsevier B. V.保留所有权利。
Using low-temperature scanning tunneling microscopy/spectroscopy we have developed a method for measuring electrostatic potential in high spatial and energy resolutions, and performed a real-space observation of the potential screened by two-dimensional surface electrons around step edges, where extra charges are localized, on the Si(1 1 1)root 3 x root 3-Ag surface. In the potential images, characteristic decay and the Friedel oscillation were clearly observed around the charges. (C) 2009 Elsevier B.V. All rights reserved.