Identification of a potential ultralow- Q -value electron-capture decay branch in Se75 via a precise Penning trap measurement of the mass of As75

Identification of a potential ultralow- Q -value electron-capture decay branch in Se75 via a precise Penning trap measurement of the mass of As75
复制标题

通过对 As75 质量进行精确潘宁陷阱测量,识别 Se75 中潜在的超低 Q 值电子捕获衰变分支

DOI:
10.1103/physrevc.106.065503
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发表时间:
2022
期刊:
影响因子:
3.1
通讯作者:
Sumithrarachchi, C. S.
Sumithrarachchi, C. S.
中科院分区:
物理与天体物理2区
文献类型:
--
作者:
Horana Gamage, M.;Bhandari, R.;Bollen, G.;Gamage, N. D.;Hamaker, A.;Puentes, D.;Redshaw, M.;Ringle, R.;Schwarz, S.;Sumithrarachchi, C. S.

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