Directional x-ray dark-field imaging
Directional x-ray dark-field imaging
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DOI：
10.1088/0031-9155/55/12/004
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发表时间：
2010-06-21
影响因子：
3.5
通讯作者：
Pfeiffer, Franz
中科院分区：
文献类型：
--
作者：
Jensen, Torben H.;Bech, Martin;Pfeiffer, Franz
我们介绍了一种新的X射线成像方法，该方法产生关于小于对象内部图像像素分辨率的结构的局部纹理的信息。该方法基于最近开发的X射线暗场成像技术，使用样品中亚微米结构的散射。结果表明，该方法可用于确定树叶中骨和纤维的局部角度和取向度。由于该方法是基于传统X射线管的使用，我们相信它将对医学诊断和无损检测应用产生重大影响。
We introduce a novel x-ray imaging approach that yields information about the local texture of structures smaller than the image pixel resolution inside an object. The approach is based on a recently developed x-ray dark-field imaging technique, using scattering from sub-micron structures in the sample. We show that the method can be used to determine the local angle and degree of orientation of bone, and fibers in a leaf. As the method is based on the use of a conventional x-ray tube we believe that it can have a great impact on medical diagnostics and non-destructive testing applications.