Voltage-induced switching of nanoscale magnetic tunnel junctions

Voltage-induced switching of nanoscale magnetic tunnel junctions
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DOI:
10.1109/iedm.2012.6479130
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发表时间:
2012-12
期刊:
2012 International Electron Devices Meeting
影响因子:
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通讯作者:
J. G. Alzate;P. Amiri;P. Upadhyaya;S. Cherepov;Jian Zhu;Mark Lewis;Richard Dorrance;J. Katine-J.-Kati
J. G. Alzate;P. Amiri;P. Upadhyaya;S. Cherepov;Jian Zhu;Mark Lewis;Richard Dorrance;J. Katine-J.-Kati
中科院分区:
其他
文献类型:
--
作者:
J. G. Alzate;P. Amiri;P. Upadhyaya;S. Cherepov;Jian Zhu;Mark Lewis;Richard Dorrance;J. Katine-J.-Kati

文献摘要

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我们展示了电压诱导(非STT)开关的纳米级,高电阻压控磁隧道结(VMTJ)的脉冲低至10纳秒。我们显示开关能量降低约10倍(与STT相比),漏电流<105 A/cm 2。开关动力学,从准静态的纳秒政权,进行了详细研究。最后,提出了一种策略,用于消除需要外部磁场,其中切换是由不同的幅度,但相同的极性的设置/复位电压,并进行了实验验证。
We demonstrate voltage-induced (non-STT) switching of nanoscale, high resistance voltage-controlled magnetic tunnel junctions (VMTJs) with pulses down to 10 ns. We show ~10x reduction in switching energies (compared to STT) with leakage currents <; 105 A/cm2. Switching dynamics, from quasi-static to the nanosecond regime, are studied in detail. Finally, a strategy for eliminating the need for external magnetic-fields, where switching is performed by set/reset voltages of different amplitudes but same polarity, is proposed and verified experimentally.