Identification of grown-in dislocations in protein crystals by digital X-ray topography
Identification of grown-in dislocations in protein crystals by digital X-ray topography
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DOI：
10.1107/s1600576720015356
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发表时间：
2021-02-01
影响因子：
6.1
通讯作者：
Tachibana, Masaru
中科院分区：
文献类型：
--
作者：
Suzuki, Ryo;Abe, Marina;Tachibana, Masaru
x射线形貌是一种有用的、无损的方法，可以直接观察近乎完美的单晶中的晶体缺陷。用数字x射线形貌成功地表征了四边形蛋清溶菌酶晶体中交联种子晶体的生长位错。通过对序列岩石曲线图像的重建，可以很容易地获得具有不同反射的数字x射线地形。位错的Burgers矢量与以前报道的不同。有趣的是，其中一个错位是弯曲的。根据位错理论，利用估计的位错能，分析了位错线的优选方向。即使在由大分子组成的蛋白质晶体中，位错能也可以用位错理论来估计。
X-ray topography is a useful and nondestructive method for direct observation of crystal defects in nearly perfect single crystals. The grown-in dislocations from the cross-linked seed crystal in tetragonal hen egg-white lysozyme crystals were successfully characterized by digital X-ray topography. Digital X-ray topographs with various reflections were easily obtained by reconstruction of sequential rocking-curve images. The Burgers vector of the dislocation is different from those reported previously. Interestingly, one of the dislocations had a bent shape. The preferred direction of the dislocation line was analysed by the estimated dislocation energy based on the dislocation theory. The dislocation energy can be estimated by the dislocation theory even in protein crystals composed of macromolecules.