Investigation of Effects of Post-Deposition Annealing on Cobalt Nanodots Embedded in Silica for Nonvolatile Memory Application

Investigation of Effects of Post-Deposition Annealing on Cobalt Nanodots Embedded in Silica for Nonvolatile Memory Application
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沉积后退火对嵌入二氧化硅中用于非易失性存储器应用的钴纳米点的影响的研究

DOI:
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发表时间:
2010
期刊:
Japanese Journal of Applied Physics (in print)
影响因子:
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通讯作者:
M. Koyanagi
M. Koyanagi
中科院分区:
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文献类型:
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作者:
Y. Pei;T. Kojima;T. Hiraki;T. Fukushima;T. Tanaka;M. Koyanagi

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