Space-Charge Aberrations in Single-Shot Time-Resolved Transmission Electron Microscopy

Space-Charge Aberrations in Single-Shot Time-Resolved Transmission Electron Microscopy
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DOI:
10.1103/physrevapplied.15.024050
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发表时间:
2020-10
期刊:
arXiv: Accelerator Physics
影响因子:
--
通讯作者:
P. Denham;P. Musumeci
P. Denham;P. Musumeci
中科院分区:
其他
文献类型:
--
作者:
P. Denham;P. Musumeci

文献摘要

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在本文中,我们讨论了空间电荷场对单次时间分辨电子显微镜(TEM)成像性能的影响。使用格林函数扰动方法,我们得出了空间电荷非线性对图像形成过程和相关像差系数影响的分析估计。阐明了这些系数对初始光束相空间分布的依赖性。结果通过粒子跟踪模拟进行了验证,并为单次时间分辨 TEM 中时间和空间分辨率之间的权衡提供了基本的比例定律。
In this paper, we discuss effects of space charge fields on imaging performance in a single shot time-resolved electron microscope (TEM). Using a Green's function perturbation method, we derive analytical estimates for the effects of space charge nonlinearity on the image formation process and the associated aberration coefficients. The dependence of these coefficients on the initial beam phase space distribution is elucidated. The results are validated by particle tracking simulations and provide fundamental scaling laws for the trade-off between temporal and spatial resolution in single-shot time-resolved TEM.