Synchrotron Radiation X-ray Fluorescence Spectrometry
Synchrotron Radiation X-ray Fluorescence Spectrometry
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同步辐射X射线荧光光谱法
DOI：
10.1002/9780470027318.a9329
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发表时间：
2013
期刊：
影响因子：
--
通讯作者：
A.Iida
中科院分区：
文献类型：
--
作者：
松本 拓隼;朝倉 裕介;下嶋 敦;黒田一幸;A.Iida
同步辐射X射线荧光（SXRF）光谱法是一种使用同步辐射（SR）作为激发源的X射线荧光（XRF）光谱法。SR是异质和复杂材料高精度XRF分析的理想光源，因为它具有光源尺寸小、发散度低、光子通量高和线偏振特性。SXRF分析正在成为生命和环境科学、医学应用、考古和文化遗产应用、法医化学、工业应用以及地球和行星科学中的一种先进和必不可少的分析技术。Micro‐SXRF提供具有高横向空间分辨率的元素成像，是最具吸引力和最重要的SXRF技术，并详细介绍了其仪器和应用。还解释了用于深度分析的共聚焦显微镜、用于三维（3D）分析的荧光断层扫描和用于快速分析的投影型成像。SR激发的全反射X射线荧光（TXRF）已被开发用于痕量元素、化学状态和表面分析。简要介绍了波长色散谱仪的发展和高能同步辐射X射线在高Z元素分析中的应用。
Synchrotron radiation X‐ray fluorescence (SXRF) spectrometry is an X‐ray fluorescence (XRF) spectrometry that uses synchrotron radiation (SR) for excitation source. SR is an ideal source for high‐precision XRF analysis of heterogeneous and complex materials because of its small source size, low divergence, high photon flux, and linearly polarized nature. SXRF analysis is becoming an advanced and essential analytical technique in life and environmental sciences, medical applications, archaeological and cultural heritage applications, forensic chemistry, industrial applications, and earth and planetary sciences.SR principles and characteristics are described in relation to SXRF analysis. Micro‐SXRF, which offers elemental imaging with high lateral spatial resolution, is the most attractive and important SXRF technique, and is detailed including its instrumentation and applications. Confocal microscopy for depth analysis, fluorescence tomography for three‐dimensional (3‐D) analysis, and projection‐type imaging for rapid analysis are also explained. SR‐excited total reflection X‐ray fluorescence (TXRF) has been developed for trace elements, chemical state, and surface analyses. The development of the wavelength‐dispersive spectrometer and the use of high‐energy synchrotron X‐rays for high‐Zelement analysis are described briefly.