Stochastic Subranging ADC Using Variable Comparator Offset Technique
Stochastic Subranging ADC Using Variable Comparator Offset Technique
复制标题
使用可变比较器偏移技术的随机分级 ADC
DOI：
10.1109/rfit49453.2020.9226236
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发表时间：
2020
期刊：
影响因子：
--
通讯作者：
K. Ohhata
中科院分区：
文献类型：
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作者：
Sintaro Uto;K. Ohhata
我们提出了一个随机分段模数转换器使用可变比较器偏移技术。可变比较器失调技术使粗调和精调转换阶段都能使用相同的比较器组;因此，只需少量比较器即可获得高分辨率。偏置电流注入器被添加到比较器，从而产生可变偏置。此外，还引入了可变偏移距平均。这些技术可以将对照组的标准差从130 mV变为5 mV。仿真结果表明，当采用255 × 9个比较器时，平均有效位数为10。
We propose a stochastic subranging analog-to-digital converter using a variable comparator offset technique. The variable comparator offset technique enables the same comparator group to be utilized in both coarse and fine conversion phases; therefore, high resolution can be obtained with a small number of comparators. The offset current injector is added to the comparator, resulting in a variable offset. Moreover, variable offset averaging is also introduced. These techniques can change the standard deviation of the comparator group from 130 to 5 mV. The simulation results show that an average effective number of bits of 10 can be obtained when 255 × 9 comparators are used.