Birefringence measurements on crystalline silicon
Birefringence measurements on crystalline silicon
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DOI：
10.1088/0264-9381/33/1/015012
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发表时间：
2016-01-07
影响因子：
3.5
通讯作者：
Lueck, Harald
中科院分区：
文献类型：
--
作者：
Krueger, Christoph;Heinert, Daniel;Lueck, Harald
晶体硅已被提议作为第三代引力波探测器（如爱因斯坦望远镜（ET））的新测试质量材料。双折射会降低干涉仪的对比度，并在干涉仪中产生动态干扰。在这项工作中，我们使用的方法偏振相关的共振频率分析的法布里-珀罗腔含有硅作为双折射介质。我们的测量结果表明，在室温下，在1550 nm的激光波长下，硅沿（111）轴的沿着双折射的数量级Δ n近似为10（-7）。提出了一个模型，解释了我们的测量作为一个叠加的弹性应变所造成的外部应力在样品和塑性应变可能在生产过程中产生的不同设置的结果。我们的理论上提出的ET测试质量的几何形状的应用表明，由于弹性应变的双折射没有关键的影响。
Crystalline silicon has been proposed as a new test mass material in third generation gravitational wave detectors such as the Einstein telescope (ET). Birefringence can reduce the interferometric contrast and can produce dynamical disturbances in interferometers. In this work we use the method of polarization-dependent resonance-frequency analysis of Fabry-Perot-cavities containing silicon as a birefringent medium. Our measurements show a birefringence of silicon along the (111) axis of the order of Delta n approximate to 10(-7) at a laser wavelength of 1550 nm and room temperature. A model is presented that explains the results of different settings of our measurements as a superposition of elastic strains caused by external stresses in the sample and plastic strains possibly generated during the production process. An application of our theory on the proposed ET test mass geometry suggests no critical effect on birefringence due to elastic strains.