T-ray topography by time-domain polarimetry.
T-ray topography by time-domain polarimetry.
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DOI：
10.1364/ol.37.002706
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发表时间：
2012-07
期刊：
影响因子：
3.6
通讯作者：
N. Yasumatsu;S. Watanabe
中科院分区：
文献类型：
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作者：
N. Yasumatsu;S. Watanabe
通过分析椭圆偏振的单周期太赫兹电磁(T-ray)脉冲的随时间变化的偏振方向，我们证明了一种显著提高太赫兹飞行时间测量的轴向分辨率的方法。结果表明，在最灵敏的情况下，该技术的轴向分辨率为∼λ/1000(<；1μm)，测量时间为亚秒，并获得了非常清晰的T射线地形图像。如此高的轴向分辨率为新型工业和生物医学应用开辟了道路，例如以安全的方式进行精细金属加工和角膜检查。
We demonstrate a method for substantially improving the axial resolution of terahertz time-of-flight measurements by analyzing the time-dependent polarization direction of an elliptically polarized single-cycle terahertz electromagnetic (T-ray) pulse. We show that, at its most sensitive, the technique has an axial resolution of ∼λ/1000 (<1 μm) with a subsecond measurement time, and very clear T-ray topographic images are obtained. Such a very high axial resolution of the T-ray topography opens the way for novel industrial and biomedical applications such as fine metalworking and corneal inspection in a safe manner.