easySLM-STED: Stimulated emission depletion microscopy with aberration correction, extended field of view and multiple beam scanning.
easySLM-STED: Stimulated emission depletion microscopy with aberration correction, extended field of view and multiple beam scanning.
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easySLM-STED：具有像差校正、扩展视场和多光束扫描功能的受激发射损耗显微镜。
DOI：
10.1002/jbio.201800087
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发表时间：
2018
影响因子：
2.8
通讯作者：
Görlitz F
中科院分区：
文献类型：
--
作者：
Görlitz F
我们展示了一种简化的STED显微镜设置，该设置具有简单的对准过程，该过程使用具有共线入射激发和耗尽光束的单个空间光调制器（SLM）来提供光束轮廓的相位调制和光学像差的校正。我们表明，这种方法可以用于扩展STED显微镜的视场，通过校正色差，否则会导致聚焦的激发和耗尽光束之间的走离。我们进一步展示了如何通过多束激发和耗尽来调整这种安排以提高成像速度。仅使用SLM就可以完成对对准的精细调整，从而具有自动化的潜力。
We demonstrate a simplified set‐up for STED microscopy with a straightforward alignment procedure that uses a single spatial light modulator (SLM) with collinear incident excitation and depletion beams to provide phase modulation of the beam profiles and correction of optical aberrations. We show that this approach can be used to extend the field of view for STED microscopy by correcting chromatic aberration that otherwise leads to walk‐off between the focused excitation and depletion beams. We further show how this arrangement can be adapted to increase the imaging speed through multibeam excitation and depletion. Fine adjustments to the alignment can be accomplished using the SLM only, conferring the potential for automation.