SPOT-SCAN IMAGING IN TRANSMISSION ELECTRON-MICROSCOPY
SPOT-SCAN IMAGING IN TRANSMISSION ELECTRON-MICROSCOPY
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DOI：
10.1126/science.1846047
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发表时间：
1991-01-04
期刊：
影响因子：
56.9
通讯作者：
DOWNING, KH
中科院分区：
文献类型：
--
作者：
DOWNING, KH
用透射电子显微镜测定蛋白质和其他有机材料的结构是一个迅速发展的领域。直到最近，获取这些对辐射敏感的标本的高分辨率图像一直是个问题。点扫描成像的发展是将电子束聚焦到直径约1000埃的一个点上，并在样品上移动以记录图像，已经克服了一些最严重的问题，这些问题是由电子束引起的样品及其图像的运动引起的。消除这一运动大大增强了图像的高分辨率特征的对比度，并有望显著提高完成未来结构工作的速度。
The determination of the structure of proteins and other organic materials by transmission electron microscopy is a rapidly developing field. Obtaining high-resolution images of these radiation-sensitive specimens has, until recently, been problematic. The development of spot-scan imaging, in which the electron beam is focused to a spot with a diameter of about 1000 angstroms and moved over the specimen to record the image, has overcome some of the most severe problems, which result from beam-induced motion of the specimen and its image. Elimination of this motion greatly enhances the contrast of high-resolution features of the image and promises a significant increase in the speed with which future structural work can be accomplished.