The magnetic trapping mode of an electron beam ion trap: New opportunities for highly charged ion research
The magnetic trapping mode of an electron beam ion trap: New opportunities for highly charged ion research
复制标题
电子束离子阱的磁捕获模式:高带电离子研究的新机遇
DOI:
10.1063/1.1147276
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发表时间:
1996
影响因子:
1.6
通讯作者:
K. Widmann
中科院分区:
文献类型:
--
作者:
P. Beiersdorfer;L. Schweikhard;José R. Crespo López;K. Widmann
Using x‐ray spectroscopic techniques, we have investigated the properties of an electron beam ion trap (EBIT) after the electron beam is switched off. In the absence of the electron beam, bare, and hydrogenlike Kr35+ and Kr36+ ions remain trapped due to externally applied magnetic and electric fields for at least 5 s; xenon ions with an open L shell, i.e., Xe45+–Xe52+, remain trapped at least as long as 20 s. The ion storage time in this ‘‘magnetic trapping mode’’ depends on the pressure of background atoms as well as on the value of the externally applied trapping potential, and even longer ion storage times appear possible. The magnetic trapping mode enables a variety of new opportunities for atomic physics research involving highly charged ions, which include the study of charge transfer reactions, Doppler‐shift‐free measurements of the Lamb shift, measurements of radiative lifetimes of long‐lived metastable levels, or ion‐ion collision studies, by x‐ray or laser spectroscopy, and mass spectrometry. Be...