Quantification of gas-phase H-atom number density by tungsten phosphate glass
Quantification of gas-phase H-atom number density by tungsten phosphate glass
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DOI：
10.1143/jjap.44.732
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发表时间：
2005-01-01
期刊：
影响因子：
--
通讯作者：
Kawazoe, H
中科院分区：
文献类型：
--
作者：
Morimoto, T;Umemoto, H;Kawazoe, H
结果表明，气相中的氢原子密度可以通过简单地测量磷酸钨玻璃板的光学透射率的变化来评估。磷酸盐玻璃板中掺杂的氧化钨（WO 3）可以通过暴露于H原子而还原，还原程度可以通过其透光率的变化来评估。还原前后透射率的差值与真空紫外激光吸收技术测定的氢原子密度呈线性关系。在不存在H原子的情况下没有观察到透射率的变化，表明H-2分子对WO 3的还原可以忽略。
It is shown that H-atom densities in the gas phase can be evaluated by simply measuring the change in optical transmittance of tungsten phosphate glass plates. Tungsten oxide (WO3) doped in phosphate glass plates can be reduced by exposure to H atoms and the degree of reduction can be evaluated from the change in their optical transmittance. The difference in the logarithms of the transmittances before and after the reduction showed a linear dependence on the H-atom density evaluated by a vacuum-ultraviolet laser absorption technique. No change in the transmittance was observed in the absence of H atoms, showing that reduction Of WO3 by H-2 molecules can be ignored.