An automatic microdensitometer for X-ray powder diffraction photographs
An automatic microdensitometer for X-ray powder diffraction photographs
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DOI：
10.1088/0022-3735/13/12/015
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发表时间：
1980-12
期刊：
影响因子：
--
通讯作者：
K. Johansson;T. Palm;P. Werner
中科院分区：
文献类型：
--
作者：
K. Johansson;T. Palm;P. Werner
本实验室设计并制造了一台微机控制的显微光密度计，用于测量粉末衍射照片。它包括一个微机控制的单光束显微密度计，使用作为测量单元的红外发射二极管（λ =940 nm），准直系统和光电二极管。扫描过程由带有两个软盘单元的微型计算机Zilog MCZ 1/05控制。微型计算机也用于数据处理。与大型计算机Amdahl 470/V7的直接连接使得从胶片安装到扫描仪的那一刻起15分钟内就可以运行索引、搜索匹配或轮廓细化程序。
A computer-controlled microdensitometer has been designed and built in this laboratory for measuring Guinier powder diffraction photographs. It consists of a microcomputer-controlled single-beam microdensitometer using as a measuring unit an IR emitting diode ( lambda =940 nm), a collimator system and a photodiode. The scan process is controlled by a microcomputer, Zilog MCZ 1/05, with two floppy disc units. The microcomputer is also used for data reduction. A direct connection with a large scale computer, Amdahl 470/V7, makes it possible to run indexing, search-match or profile refinement programs within 15 minutes from the moment the film is mounted in the scanner.