Micron-scale laser-wire scanner for the KEK Accelerator Test Facility extraction line
Micron-scale laser-wire scanner for the KEK Accelerator Test Facility extraction line
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用于 KEK 加速器测试设施提取线的微米级激光线扫描仪
DOI：
10.1103/physrevstab.13.122801
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发表时间：
2010
期刊：
影响因子：
--
通讯作者：
Boogert S
中科院分区：
文献类型：
--
作者：
Boogert S
在KEK的加速器测试设备（ATF）提取线上，建立并运行了一套激光线横向电子束尺寸测量系统。详细介绍了系统的构成以及与激光线材相关的ATF环境。开发了一套特殊的电子束光学装置，以在激光线位置产生近似垂直的焦点。本文介绍了我们在ATF萃取线上的操作结果，其中测量了最小均方根电子束尺寸，并且通过进一步发展该方法可以测量更小的电子束尺寸。利用四极杆改变激光线位置的电子束尺寸，测量产生的电子束尺寸，并提取垂直发射度。
A laser-wire transverse electron beam size measurement system has been constructed and operated at the Accelerator Test Facility (ATF) extraction line at KEK. The construction of the system is described in detail along with the environment of the ATF related to the laser wire. A special set of electron beam optics was developed to generate an approximatelyvertical focus at the laser-wire location. The results of our operation at the ATF extraction line are presented, where a minimum rms electron beam size ofwas measured, and smaller electron beam sizes can be measured by developing the method further. The beam size at the laser-wire location was changed using quadrupoles and the resulting electron beam size measured, and vertical emittance extracted.