A Control System for Keyhole Plasma Arc Welding of Stainless Steel Plates with Medium Thickness
A Control System for Keyhole Plasma Arc Welding of Stainless Steel Plates with Medium Thickness
复制标题
中等厚度不锈钢板小孔等离子弧焊控制系统
作者：
Wu, C. S.;Jia, C. B.;Chen, M. A.
小孔等离子弧焊(PAW)具有熔深大、熔深窄、成本低、接头制备公差大等优点。然而，与小孔条件相关的窄参数窗口限制了它的广泛应用，特别是在焊接较厚的板材时。为了充分发挥其潜力，研制了一套小孔焊枪控制系统。实时检测出射等离子体电压信号以表征小孔的大小和尺寸。设计了两个缓降子阶段和可变斜率的焊接电流波形，通过减小小孔从打开状态到闭合状态时的热输入和电弧力，提高了小孔动力学的可控性。为了验证系统的控制效果，进行了小孔手爪实验。研制的系统工作在“一脉一小孔”模式下，工作稳定可靠。变厚度钢板的闭环控制试验表明，即使钢板厚度变化50%(从8 mm到4 mm)，所开发的系统也能自动调整峰值电流及其下降斜率，以保持焊缝宽度和熔深的一致性。
Keyhole plasma arc welding (PAW) has the potential to achieve deep, narrow penetration with low cost and high tolerance of joint preparation. However, the narrow parameter window associated with the keyhole condition limits its wide application, especially for welding thicker plates. To reach its full potential, a control system for keyhole PAW is developed. The efflux plasma voltage signal is detected in real-time to characterize the keyhole size and dimension. The welding current waveform with two slow dropping substages and variable slopes is designed to improve the controllability of keyhole dynamics via reducing both heat input and arc force when a keyhole transforms from its opening status to the closure status. The keyhole PAW experiments are conducted to examine the control effectiveness of the system. The developed system operates in the mode of "one keyhole per pulse" reliably. Closed-loop control tests of varied-thickness plates show that even if the plate thickness changes as much as 50% (from 8 to 4 mm), the developed system adjusts the peak current and its dropping slopes automatically to keep both weld width and penetration consistent.
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影响因子：
2.2
作者：
E. P. Vilkas
通讯作者：
E. P. Vilkas
DOI：
--
发表时间：
1990
期刊：
--
影响因子：
--
作者：
R. Keanini;B. Rubinsky
通讯作者：
R. Keanini;B. Rubinsky
影响因子：
4.2
作者：
Chun Dong
通讯作者：
Chun Dong
DOI：
--
发表时间：
2000
期刊：
--
影响因子：
--
作者：
Shao Yichen
通讯作者：
Shao Yichen
影响因子：
2.4
作者：
Yuming Zhang;S. B. Zhang;Y. C. Liu
通讯作者：
Yuming Zhang;S. B. Zhang;Y. C. Liu