Application of Laser‐Backscattering Instruments for In Situ Monitoring of Crystallization Processes – A Review
Application of Laser‐Backscattering Instruments for In Situ Monitoring of Crystallization Processes – A Review
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激光背散射仪器在结晶过程原位监测中的应用——综述
DOI：
10.1002/ceat.201100344
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发表时间：
2012
影响因子：
2.1
通讯作者：
J. Ulrich
中科院分区：
文献类型：
--
作者：
J. Heinrich;J. Ulrich
激光背散射仪器，例如聚焦光束反射率测量或三重动态光学反射率测量，是有助于结晶过程开发的有前途的工具，可以对粒度分布进行原位、实时和无损测量。除了仪器原理之外，还详细讨论了对记录的弦长分布进行解卷积的几何和光学模型。因此重点在于悬浮液密度对仪器记录的影响。讨论了激光背散射装置在测定动力学常数中的应用，并给出了未来的方向和前景。
Laser-backscattering instruments, such as the focused beam reflectance measurement or threefold dynamical optical reflectance measurement, are promising tools to aid crystallization process development, allowing an in situ, real-time, and nondestructive measurement of particle size distributions. Besides the instrument principles, in detail geometrical and optical models are discussed which deconvolute the recorded chord length distribution. Emphasis is thereby laid on the influence of the suspension density on instrument recordings. The application of laser-backscattering devices for determination of kinetic constants is discussed and future directions and perspectives are given.