X-ray reflectivity study of the water-hexane interface
X-ray reflectivity study of the water-hexane interface
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DOI：
10.1021/jp984640o
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发表时间：
1999-02
影响因子：
3.3
通讯作者：
D. M. Mitrinovic;Zhongjian Zhang;Scott Williams;A. Huang;M. Schlossman
中科院分区：
文献类型：
--
作者：
D. M. Mitrinovic;Zhongjian Zhang;Scott Williams;A. Huang;M. Schlossman
用同步加速器x射线反射率法研究了垂直于体积水-己烷界面的电子密度分布。这是第一次测量干净的水-油界面的微观界面宽度，这依赖于一种新技术的发展，该技术可以使液-液界面变平。测量结果用误差函数电子密度谱解释，得到界面宽度为0.33±0.025 nm。在毛细波理论的背景下，该微观参数与界面张力的宏观测量结果一致。这些测量结果与水-烷烃界面的计算机模拟结果进行了比较。
Synchrotron X-ray reflectivity is used to study the electron density profile normal to the bulk water−hexane interface. This first measurement of the microscopic interfacial width of a neat water−oil interface relied upon the development of a novel technique to flatten the liquid−liquid interface. The measurement is interpreted in terms of an error function electron density profile to yield an interfacial width of 0.33 ± 0.025 nm. Within the context of capillary wave theory, it is shown that this microscopic parameter is in agreement with macroscopic measurements of the interfacial tension. These measurements are compared to computer simulations of water−alkane interfaces.