Power-Up SRAM State as an Identifying Fingerprint and Source of True Random Numbers
Power-Up SRAM State as an Identifying Fingerprint and Source of True Random Numbers
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DOI：
10.1109/tc.2008.212
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发表时间：
2009-09-01
影响因子：
3.7
通讯作者：
Fu, Kevin
中科院分区：
文献类型：
--
作者：
Holcomb, Daniel E.;Burleson, Wayne P.;Fu, Kevin
断断续续的功率应用程序需要在潜在敌对环境中进行低成本安全性和隐私，并得到了包括标识和随机数生成在内的原始人的支持。我们的测量表明，SRAM的电源产生了物理指纹。我们提出了一个指纹提取系统和SRAM（蕨类植物）中随机数的系统，该系统从现有挥发性CMOS内存中收获静态身份和随机性，而无需任何专用电路。该身份是由制造时间随机随机设备阈值不匹配而产生的，随机数是由运行时随机噪声导致的。我们使用来自高性能SRAM芯片的实验数据和WISP UHF RFID标签的嵌入式SRAM来验证蕨类植物背后的原理。对于SRAM芯片，我们证明了8个字节的指纹可以唯一地识别5120个实例人群中的电路，并推断出24字节的指纹将独特地识别出所有产生的实例。使用较小的人群，我们证明了来自嵌入式SRAM的类似识别能力。除了识别外，我们还表明SRAM指纹捕获噪声，从而实现真实的随机数。我们证明了512字节SRAM指纹包含足够的熵来生成128位真实的随机数，并且生成的数字通过运行，近似熵和块频率的NIST测试。
Intermittently powered applications create a need for low-cost security and privacy in potentially hostile environments, supported by primitives including identification and random number generation. Our measurements show that power-up of SRAM produces a physical fingerprint. We propose a system of Fingerprint Extraction and Random Numbers in SRAM (FERNS) that harvests static identity and randomness from existing volatile CMOS memory without requiring any dedicated circuitry. The identity results from manufacture-time physically random device threshold voltage mismatch, and the random numbers result from runtime physically random noise. We use experimental data from high-performance SRAM chips and the embedded SRAM of the WISP UHF RFID tag to validate the principles behind FERNS. For the SRAM chip, we demonstrate that 8-byte fingerprints can uniquely identify circuits among a population of 5,120 instances and extrapolate that 24-byte fingerprints would uniquely identify all instances ever produced. Using a smaller population, we demonstrate similar identifying ability from the embedded SRAM. In addition to identification, we show that SRAM fingerprints capture noise, enabling true random number generation. We demonstrate that a 512-byte SRAM fingerprint contains sufficient entropy to generate 128-bit true random numbers and that the generated numbers pass the NIST tests for runs, approximate entropy, and block frequency.