Development of New Beam Profile and Emittance Measurement System for HLS
Development of New Beam Profile and Emittance Measurement System for HLS
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开发新的 HLS 光束轮廓和发射度测量系统
DOI：
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发表时间：
2006
期刊：
影响因子：
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通讯作者：
Wang Bao-Yun
中科院分区：
文献类型：
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作者：
Zheng Pu;Wang Jun-Hua;Lu Ping;Xu Hong-Liang;Sun Bao-Gen;Wang Ji-Gang;Wang Bao-Yun
本文介绍了HLS（合肥光源）紫外光束轮廓和发射度测量系统。该系统基于光学测量，由光学成像和图像采集两个功能块组成。光学成像系统是将SR的紫外部分在CCD表面形成1:1的图像。图像采集系统接收来自CCD相机的NTSC信号，采集SR紫外部分的图像，通过Lab VIEW程序对信号进行处理，获得光束轮廓尺寸、发射率以及垂直和水平方向耦合等光束信息。还给出了一些测量结果。
The paper describes the ultraviolet light beam profile and emittance measurement system for HLS (Hefei Light Source). The system is based on the optical measurement, composed by two functional blocks: optical imaging and image acquisition. The optical imaging system is to form the 1:1 image of the ultraviolet part of SR on the surface of the CCD. The image acquisition system receives NTSC signal from the CCD camera which acquires the image of the ultraviolet part of SR, the signal is processed by a Lab VIEW program to obtain the beam information of beam profile size, emittance and coupling between vertical and horizontal directions. Some measured results are also given.