Plasmon modes of a silver thin film taper probed with STEM-EELS.
Plasmon modes of a silver thin film taper probed with STEM-EELS.
复制标题
使用 STEM-EELS 探测银薄膜锥体的等离激元模式。
作者：
F. Schmidt;H. Ditlbacher;A. Trügler;U. Hohenester;A. Hohenau;F. Hofer;J. Krenn
通过聚焦传播的表面等离子体，电磁能可以传递到纳米级体积。在这种情况下，我们在扫描透射电子显微镜中采用电子能量损失光谱来表征逐渐变尖的银薄膜的全等离子体模式光谱。我们证明等离激元模式可以按薄膜和边缘模式排序，并通过补充数值模拟证实我们的分配。特别是，我们发现锥尖处的聚焦等离子体场是由边缘模式推动的。
By focusing propagating surface plasmons, electromagnetic energy can be delivered to nanoscale volumes. In this context, we employ electron energy loss spectroscopy in a scanning transmission electron microscope to characterize the full plasmonic mode spectrum of a silver thin film tapered to a sharp tip. We show that the plasmon modes can be ordered in film and edge modes and corroborate our assignment through supplementary numerical simulations. In particular, we find that the focused plasmon field at the taper tip is fueled by edge modes.