Charge carriers localization in intercalation compounds based on dichalcogenides of titanium
Charge carriers localization in intercalation compounds based on dichalcogenides of titanium
复制标题
基于钛二硫属化物的插层化合物中的载流子定位
DOI：
10.1080/10587259808042382
复制
发表时间：
1998
影响因子：
0.7
通讯作者：
A. Kuranov
中科院分区：
文献类型：
--
作者：
A. Titov;S. Titova;M. Neumann;V. Pleschov;Y. Yarmoshenko;L. S. Krasavin;A. V. Dolgoshein;A. Kuranov
摘要对FexTiTe_2进行了X射线光电子能谱研究，并对AgxTiTe_2的热力学函数进行了研究。结果表明，Ag和Fe嵌入TiTe2导致费米能级的窄带上升，这可能是由于宿主晶格层之间出现了共价“桥”。
Abstract X-ray photoemission study for FexTiTe2 and investigation of thermodynamic functions for AgxTiTe2 were carried out. It was shown that intercalation of Ag and Fe into TiTe2 leads to a rising of a narrow band at the Fermi level, probably due to appearance of the covalent “bridges” between the host lattice layers.