Applied Charged Particle Optics
Applied Charged Particle Optics
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DOI：
10.1007/978-3-540-71925-0
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发表时间：
2007-11
期刊：
影响因子：
--
通讯作者：
H. Liebl
中科院分区：
文献类型：
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作者：
H. Liebl
这本小册子基本上是我在位于加尔兴/慕尼黑的马克斯·普朗克等离子体物理研究所为在该研究所工作的物理学家和研究生以及附近的技术大学物理系教授的一门课程的扩展英语版本。它涵盖了我在职业生涯中设计，建造和工作的粒子光学的大部分应用，例如质谱仪，离子束聚焦，发射显微镜，离子和电子束系统，能量范围小于20 keV。它的目的是帮助物理学家设计自己的仪器或帮助他们更好地了解他们必须使用的仪器。所描述的一些主题可以追溯到相当长的一段时间，最古老的参考资料可以追溯到上个世纪的30年代。我已经足够大了，可以亲自会见其中的一些作者。但这本小册子也包含了一些我自己档案中的材料，这些材料以前没有出版过。
This booklet is essentially an extended English version of a course I taught at the Max Planck Institute for Plasma Physics in Garching/Munich for physicists and graduate students working at the Institute and for the nearby Physics Department of the Technical University. It covers mostly applications of particle optics which I have designed, built and worked with myself during my career, such as mass spectrometry, focusing of ion beams, emission microscopy, ion and electron beam systems, in an energy range of less than 20 keV. It is intended to help physicists who have to design their own apparatus or to help them to better understand instruments they have to work with.Some of the subjects described date back quite some time, the oldest references as far back as the thirties in the last century. And I am old enough to have met some of those authors personally. But the booklet also contains some material from my own file which has not been published previously.