Interpretation of Kerr Microscopic Domain Contrast on Curved Surfaces
Interpretation of Kerr Microscopic Domain Contrast on Curved Surfaces
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曲面上克尔微观域对比的解释
DOI：
10.1109/lmag.2021.3116791
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发表时间：
2021
影响因子：
1.2
通讯作者：
Rudolf Schäfer
中科院分区：
文献类型：
--
作者：
Ivan Soldatov;Valeria Kolesnikova;Valeria Rodionova;Rudolf Schäfer
在这封信中，我们解决了宽场磁光克尔显微镜的技术特点，这可能很容易导致误解的域对比度曲面。在铁磁微丝的圆周磁化域的例子中，我们表明，棋盘域图案，这通常显示在极性克尔灵敏度，是由纵向克尔对比度的叠加所引起的，所产生的面内磁化分量和倾斜的光入射，而不是从垂直于焦平面的磁化分量在文献中所要求的。实验方法，以避免这种奇特的对比证明。
In this letter, we address a technical peculiarity of wide-field magneto-optical Kerr microscopy, which may easily lead to a misinterpretation of the domain contrast on curved surfaces. On the example of circumferentially magnetized domains in ferromagnetic microwires, we show that the checkerboard domain pattern, which typically shows up in polar Kerr sensitivity, is caused by the superposition of longitudinal Kerr contrasts that arise from in-plane magnetization components and inclined light incidence rather than from the magnetization components perpendicular to the focal plane as claimed in the literature. Experimental ways to avoid such peculiar contrasts are demonstrated.