Low latency demodulation for Atomic Force Microscopes, Part I efficient real-time integration

Low latency demodulation for Atomic Force Microscopes, Part I efficient real-time integration
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原子力显微镜的低延迟解调,第 I 部分高效实时集成

DOI:
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发表时间:
2011
期刊:
Proceedings of the 2011 American Control Conference
影响因子:
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通讯作者:
D. Abramovitch
D. Abramovitch
中科院分区:
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文献类型:
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作者:
D. Abramovitch

文献摘要

被引文献

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本文描述了在原子力显微镜(AFM)中对动态或AC模式的信号进行高速、低延迟、相干解调的方法[1]。这些解调方法允许系统在基本振荡频率的一个周期内提取信号信息。通过具有如此小的延迟,解调器使AC模式AFM的伺服回路中的时间延迟最小化。这又使解调的负相位效应最小化,从而允许更高速度的扫描。本文的这一部分描述了解调器的混频和积分部分。第二部分[2]描述了真实的实时提取幅度和相位的有效方法。
This paper describes methods for doing high speed, low latency, coherent demodulation of signals for dynamic or AC mode in Atomic Force Microscopes (AFMs) [1]. These demodulation methods allow the system to extract signal information in as little as one cycle of the fundamental oscillation frequency. By having so little latency, the demodulator minimizes the time delay in the servo loop for an AC mode AFM. This in turn minimizes the negative phase effects of the demodulation allowing for higher speed scanning. This part of the paper describes the mixing and integration portion of the demodulator. Part II [2] describes efficient methods for extracting magnitude and phase in real time.