Structural investigation of As-Se chalcogenide thin films with different compositions: formation, characterization and peculiarities of volume and near-surface nanolayers
Structural investigation of As-Se chalcogenide thin films with different compositions: formation, characterization and peculiarities of volume and near-surface nanolayers
复制标题
不同成分的 As-Se 硫属化物薄膜的结构研究：体积和近表面纳米层的形成、表征和特性
DOI：
10.15407/fm24.04.547
复制
发表时间：
2017
期刊：
影响因子：
--
通讯作者：
N. Tsud
中科院分区：
文献类型：
--
作者：
O. Kondrat;R. Holomb;V. Mitsa;M. Veres;N. Tsud
