Wide-field high-resolution surface-plasmon interference microscopy.

Wide-field high-resolution surface-plasmon interference microscopy.
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DOI：
10.1364/ol.34.003110
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发表时间：
2009-10
期刊：
Optics letters
影响因子：
3.6
通讯作者：
M. Somekh;G. Stabler;Shugang Liu;Jing Zhang-;C. See
M. Somekh;G. Stabler;Shugang Liu;Jing Zhang-;C. See
中科院分区：
物理与天体物理2区
文献类型：
--
作者：
M. Somekh;G. Stabler;Shugang Liu;Jing Zhang-;C. See

文献摘要

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We describe a wide-field interferometric surface-plasmon microscope capable of submicrometer resolution. The system is a speckle-illuminated Linnik interferometer, which behaves as a wide-field analog of a scanning heterodyne interferometer. The presented images demonstrate contrast reversals at different defocus while retaining submicrometer lateral resolution. The contrast mechanisms are discussed as well as the instrumental requirements of the technique.