Combining on-line fault detection and logic self repair
Combining on-line fault detection and logic self repair
复制标题
在线故障检测与逻辑自修复相结合
DOI：
10.1109/ddecs.2012.6219076
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发表时间：
2012
期刊：
影响因子：
--
通讯作者：
H. Vierhaus
中科院分区：
文献类型：
--
作者：
T. Koal;Markus Ulbricht;H. Vierhaus
近年来，许多作者已经解决了纳米电子电路和系统对瞬态故障和磨损效应的日益脆弱性。因此，现在和未来的电子系统需要对不同类型的故障影响具有弹性，以实现长期可靠的操作。故障检测、错误补偿以及修复技术需要额外硬件资源的大量开销，这增加了系统大小、成本和功耗。在本文中，我们提出了第一次尝试，联合收割机资源的瞬态故障处理和永久故障修复在一个统一的方法。
In recent years many authors have addressed the growing vulnerability of nano-electronic circuits and systems to transient faults and wear-out effects. Hence present and even more future electronic systems need the property of resilience against different types of fault effects for long-term dependable operation. Fault detection, error compensation, and also repair technologies require a substantial overhead in extra hardware resources, which add to system size, cost and power consumption. In this paper we present a first attempt to combine resources for transient fault handling and for permanent fault repair in a unified approach.