FTC: A Universal Sensor for Fault Injection Attack Detection

FTC: A Universal Sensor for Fault Injection Attack Detection
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FTC:用于故障注入攻击检测的通用传感器

DOI:
10.1109/host54066.2022.9840177
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发表时间:
2022
期刊:
2022 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)
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通讯作者:
Farimah Farahmandi
Farimah Farahmandi
中科院分区:
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文献类型:
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作者:
Md Rafid Muttaki;Tao Zhang;M. Tehranipoor;Farimah Farahmandi

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在过去的二十年里,故障注入方法已经发展成为非常有效的攻击,导致集成电路或电子系统的完整性或一致性侵犯。故障注入攻击(FIA)可以使用时钟毛刺、电压毛刺、激光、光学仪器、电磁(EM)发射等进行。检测FIA的一个有前途的解决方案是使用片上传感器来捕获攻击的效果。然而,具有不同类型和技术的FIA强制使用针对每种类型攻击的定制设计的传感器,这具有挑战性并引入了大量开销。为了解决这个问题,在本文中,我们建议开发一个通用的故障到时间转换器(FTC)传感器,可以有效地检测所有上述FIA,同时需要最小的开销。FTC传感器将FIA方法注入的故障影响转换为可测量的“时间”。然后,可以进一步分析“时间”差,以确定攻击是否已成功实施。我们的FTC传感器在FPGA平台上的实现表明,该设计可以有效地区分各种FIA攻击的情况下,其编码输出。FTC传感器还可以被扩展以覆盖对受害者设备具有类似影响的其他故障攻击(即,影响电路定时)。
Over the past two decades, fault-injection methods have evolved into very effective attacks to cause integrity or con-fidentiality violations in integrated circuits or electronic systems. Fault-injection attacks (FIAs) can be carried out using clock-glitch, voltage glitch, laser, optical instruments, electromagnetic (EM) emanation, and more. One promising solution to detect FIAs is to use on-chip sensors to capture the attacks' effect. However, having different types and techniques of FIAs enforces using the custom-designed sensors for each type of attack, which is challenging and introduces a large overhead. To address this, in this paper, we propose to develop a universal Fault-to- Time Converter (FTC) sensor that can effectively detect all the above-mentioned FIAs while requiring minimal overhead. The FTC sensor converts the effect of faults injected by an FIA method into “time” that is measurable. Then, the “time” difference can be analyzed further to identify whether an attack has been carried out successfully. Our FTC sensor implementation in FPGA platforms demonstrates that the design can effectively differentiate various FIA attack scenarios with its encoded output. The FTC sensor can also be extended to cover other fault attacks that have a similar impact on the victim device (i.e., affecting circuit timing).