Change of the Surface Structure by F Doping in BiS2-Based Superconductor CeO1-xFxBiS2
Change of the Surface Structure by F Doping in BiS2-Based Superconductor CeO1-xFxBiS2
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BiS2基超导体CeO1-xFxBiS2中F掺杂改变表面结构
DOI：
10.1016/j.phpro.2016.04.021
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发表时间：
2016
期刊：
影响因子：
--
通讯作者：
Y. Takano and H. Sakata
中科院分区：
文献类型：
--
作者：
S. Demura;Y. Fujisawa;T. Machida;M. Nagao;Y. Takano and H. Sakata
用扫描隧道显微镜成功地观察了单晶CeO1-xFxBiS2(x=0.5和0.7)的表面结构。在x=0.5的样品中，观察到由铋原子组成的正方形晶格。此外，与NdO_(0.7)F_(0.3)BiS_2单晶一样，在表面也发现了表面原子缺陷和条纹。随着F的进一步掺杂，x=0.7时样品的表面结构呈现出一种新的结构，称为“骨”结构。这一结果表明，氟的浓度影响表面结构。
The observation of the surface structure on single crystalline CeO1-xFxBiS2(x= 0.5, and 0.7) was performed successfully using a scanning tunneling microscopy. In the sample withx= 0.5, the square lattice composed of Bi atoms was observed. In addition, defects of the surface atoms and streaks were detected on the surface as in the case of NdO0.7F0.3BiS2single crystal. With further F doping, the surface structure of sample withx= 0.7 showed a novel structure, termed by the “bone” structure. This result suggests that the F concentration affects the surface structure.