Optical measurement techniques for surface and bulk charge distribution
Optical measurement techniques for surface and bulk charge distribution
复制标题
DOI：
10.1109/icsd.2004.1350591
复制
发表时间：
2004-07
期刊：
影响因子：
--
通讯作者：
Y. Tanaka;Y. Usui;K. Umemura;T. Takada;R. Watanabe;N. Tomita
中科院分区：
文献类型：
--
作者：
Y. Tanaka;Y. Usui;K. Umemura;T. Takada;R. Watanabe;N. Tomita
利用光学方法测量了电介质材料上和电介质材料中的表面和体电荷分布。在空间环境中，航天器受到高能宇宙射线的照射。当宇宙射线照射到航天器上时，航天器表面绝缘材料的电势充电。有时，电势的变化会导致静电放电（ESD）的意外事故，对电子设备造成严重损坏。为了了解静电放电的机理，需要测量电介质材料表面的电荷分布和/或电介质材料中的体电荷分布。因此，我们提出了使用光学方法，使用普克尔斯和克尔效应的表面和体电荷分布的测量，分别。利用这些方法，我们已经成功地测量了Kapton/spl reg/上的表面电荷分布和电子束辐照PMMA中的体电荷分布。本文在简要介绍测量原理的基础上，对光学测量结果进行了总结。
Surface and bulk charge distribution on and in dielectric materials is measured using optical methods. In space environment, a spacecraft is exposed by high-energy cosmic rays. The electric potential of insulating materials on the surface of the spacecraft charged up when the cosmic rays are irradiated to the spacecraft. Sometimes, the change of the electric potential causes an unexpected accident of electrostatic discharge (ESD) with serious damage to the electric devices. To understand the mechanism of the ESD, the measurement of charge distribution on surface of the dielectric materials and/or bulk charge distribution in dielectric materials should be carried out. Therefore, we have proposed to use an optical method using Pockels and Kerr effects for the measurement of surface and bulk charge distributions, respectively. Using these methods, we have already succeeded in measuring the surface charge distribution on Kapton/spl reg/ and measuring the bulk charge distribution in PMMA irradiated by electron beam. In this paper, a summary for the optical measurement results is introduced following the brief explanation of the measurement principles.