Phase Diffusion in Low-EJ Josephson Junctions at Milli-Kelvin Temperatures
Phase Diffusion in Low-EJ Josephson Junctions at Milli-Kelvin Temperatures
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DOI:
10.3390/electronics12020416
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发表时间:
2023-01-01
期刊:
影响因子:
2.9
通讯作者:
Gershenson, Michael E.
中科院分区:
文献类型:
--
作者:
Lu, Wen-Sen;Kalashnikov, Konstantin;Gershenson, Michael E.
Josephson junctions (JJs) with Josephson energy E-J less than or similar to 1 K are widely employed as non-linear elements in superconducting circuits for quantum computing operating at milli-Kelvin temperatures. In the qubits with small charging energy E-C ( E-J/E-C >> 1 ), such as the transmon, the incoherent phase slips (IPS) might become the dominant source of dissipation with decreasing E-J. In this work, a systematic study of the IPS in low-E-J JJs at milli-Kelvin temperatures is reported. Strong suppression of the critical (switching) current and a very rapid growth of the zero-bias resistance due to the IPS are observed with decreasing E-J below 1 K. With further improvement of coherence of superconducting qubits, the observed IPS-induced dissipation might limit the performance of qubits based on low-E-J junctions. These results point the way to future improvements of such qubits.