Enhanced Functionality of Nanotube Atomic Force Microscopy Tips by Polymer Coating
Enhanced Functionality of Nanotube Atomic Force Microscopy Tips by Polymer Coating
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DOI：
10.1021/nl0350581
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发表时间：
2004-01
期刊：
影响因子：
10.8
通讯作者：
A. Patil;J. Sippel;Gregory W. Martin;A. Rinzler
中科院分区：
文献类型：
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作者：
A. Patil;J. Sippel;Gregory W. Martin;A. Rinzler
为了稳定纳米管修饰的原子力显微镜尖端并扩展其功能，描述了一种对尖端进行保形聚合物涂层并仅从探测纳米管末端去除聚合物的方法。开发了量化尖端稳定性的表达式，以防止成像时遇到的应力导致的屈曲和弯曲。探针的电导率通过其在扫描电导显微镜中的使用得到证明，其中实现并解释了相对于标准尖端的显着灵敏度优势。讨论了这些电绝缘（除了尖端）探针的更多优点，包括它们在生物电化学研究中的拟议应用。
To stabilize nanotube-modified atomic force microscopy tips and extend their functionality, a method for conformal polymer coating of the tips and removal of the polymer from just the probing nanotube end is described. Expressions quantifying stabilization of the tips against buckling and bending due to stresses encountered while imaging are developed. Electrical conductivity of the probes is demonstrated by their use in scanned conductance microscopy, where a substantial sensitivity advantage over standard tips is realized and explained. Further advantages of these electrically insulated (save for the tip) probes are discussed, including their proposed application in bioelectrochemical research.