Radiation-induced conductivity of AlO: Experiment and theory
Radiation-induced conductivity of AlO: Experiment and theory
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DOI：
10.1103/physrevb.21.3610
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发表时间：
1980-04
影响因子：
3.7
通讯作者：
R. Klaffky;B. H. Rose;A. Goland;G. Dienes
中科院分区：
文献类型：
--
作者：
R. Klaffky;B. H. Rose;A. Goland;G. Dienes
测量了在1.5 MeV电子连续辐照过程中保持高温的单晶Al/sub2/O/sub3/样品的稳态辐射感生电导率(RIC)。提出了一个理论模型，在该模型中，RIC中观察到的快速增长与电子的热脱陷态有关。为了解释RIC的减小，考虑了描述空穴释放引起的导电性热猝灭的附加速率方程。未掺杂样品的RIC数据表明，0.77-eV V/sup-//subOH/中心的空穴释放可能是对电导的热猝灭，除了热猝灭之外，还有几种机制可以解释RIC的微弱下降。这些是传导电子的Lo声子散射(“大极化子”迁移率)和通过多声子发射发生的整体电子-空穴复合。
The steady-state radiation-induced conductivity (RIC) has been measured in single-crystal Al/sub 2/O/sub 3/ samples maintained at elevated temperatures during continuous irradiation with 1.5-MeV electrons. A theoretical model is presented in which the rapid increases observed in the RIC are correlated with the thermal detrapping of electrons. To account for the decreases in the RIC, additional rate equations describing the thermal quenching of the conductivity by hole release are considered. The RIC data of the undoped samples indicate that hole release from 0.77-eV V/sup -//sub OH/ centers may be thermally quenching the conductivity.There are several mechanisms other than thermal quenching which could account for the weak decreases in the RIC. These are the LO-phonon scattering of conduction electrons (''large-polaron'' mobility) and bulk electron-hole recombination occurring through multiphonon emission.