Extended Probe Instrument Calibration (EPIC) for Accurate Spherical Near-Field Antenna Measurements
Extended Probe Instrument Calibration (EPIC) for Accurate Spherical Near-Field Antenna Measurements
复制标题
用于精确球形近场天线测量的扩展探头仪器校准 (EPIC)
DOI：
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发表时间：
2009
影响因子：
5.7
通讯作者：
R. Pogorzelski
中科院分区：
文献类型：
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作者：
R. Pogorzelski
介绍了一种消除球形近场天线测量误差的探针校准技术。该技术基于对已知天线的初步校准测量，该过程根据一组校正系数来表征探针和测量室中包括墙壁在内的任何固定物体。这些系数然后用于校正算法，从损坏的测量数据中恢复正确的天线方向图。
A probe calibration technique is described that removes artifacts from spherical near-field antenna measurements. The technique is based on preliminary calibration measurements of a known antenna, a process that characterizes the probe and any stationary objects in the measurement chamber including the walls in terms of a set of correction coefficients. These coefficients are then used in a correction algorithm that recovers the correct antenna pattern from the corrupted measurement data.