Decoupling indirect topographic cross-talk in band excitation piezoresponse force microscopy imaging and spectroscopy
Decoupling indirect topographic cross-talk in band excitation piezoresponse force microscopy imaging and spectroscopy
复制标题
带激发压电响应力显微镜成像和光谱学中间接形貌串扰的解耦
DOI：
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发表时间：
2016
期刊：
影响因子：
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通讯作者：
Sergei V. Kalinin
中科院分区：
文献类型：
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作者：
Sang Mo Yang;L. Mazet;M. Okatan;S. Jesse;G. Niu;T. Schroeder;S. Schamm;C. Dubourdieu;A. Baddorf;Sergei V. Kalinin
所有扫描探头显微镜都受到地形串扰的影响，这意味着功能图像中与地形相关的对比度。在这里，我们研究了压电响应力显微镜成像和光谱中的间接形貌串扰特征，以及用带激励(BE)方法在直径为50 nm的硅衬底上沉积的铁电BaTiO_3中的去耦合。单频PFM和BE-PFM的比较结果表明，由于地形引起的接触共振频率和悬臂梁传递函数的漂移，测量信号会产生严重的失真。然而，经过适当的校正，这种偏移不会影响PFM成像和磁滞回线测量。这表明需要一种先进的方法，如BE-PFM，来检测非均匀表面上的本征样品的压电响应。
All scanning probe microscopies are subjected to topographic cross-talk, meaning the topography-related contrast in functional images. Here, we investigate the signatures of indirect topographic cross-talk in piezoresponse force microscopy (PFM) imaging and spectroscopy and its decoupling using band excitation (BE) method in ferroelectric BaTiO3 deposited on the Si substrates with free standing nanopillars of diameter 50 nm. Comparison between the single-frequency PFM and BE-PFM results shows that the measured signal can be significantly distorted by topography-induced shifts in the contact resonance frequency and cantilever transfer function. However, with proper correction, such shifts do not affect PFM imaging and hysteresis loop measurements. This suggests the necessity of an advanced approach, such as BE-PFM, for detection of intrinsic sample piezoresponse on the topographically non-uniform surfaces.
影响因子：
8.6
作者：
Liu Y;Zhang Y;Chow MJ;Chen QN;Li J
通讯作者：
Li J